Absorbed current imaging provides a spatial image of the amount of beam current absorbed by the sample. Electrons in the beam that do not form backscattered or secondary electrons eventually lose their energy and are captured within the sample (unless the sample is very thin). These absorbed electrons produce an electric charge in the sample that must be conducted to ground. The current flowing to ground from the sample thus provides information similar to that of a combined backscatter electron and secondary electron image. The pictures below are absorbed current images of a grid made up of Cu (thick bars), Ag (thin bars), and chrome steel (substrate).
